Editura: Springer Verlag New York Inc., 28 de titluri

Coperta cărții Scanning Electron Microscopy and X-Ray Microanalysis

Nicholas W. M. Ritchie,Dale Newbury,David C. Joy,Joseph Michael,Joseph Goldstein,John Henry Scott

Coperta cărții Linear and Nonlinear Optimization

Richard W. Cottle,Mukund N. Thapa

Coperta cărții Finite Element Concepts

Gautam Dasgupta

Coperta cărții Free Probability and Random Matrices

James A. Mingo,Roland Speicher

Coperta cărții Multivariate Analysis of Ecological Data with ade4

Jean Thioulouse,Stephane Dray,Anne Beatrice Dufour,Aurelie Siberchicot,Thibaut Jombart,Sandrine Pavoine

Coperta cărții Semiparametric Regression with R

Jaroslaw Harezlak,David Ruppert,Matt P. Wand