Scanning Electron Microscopy and X-Ray Microanalysis

Scanning Electron Microscopy and X-Ray Microanalysis

Autor

Nicholas W. M. Ritchie Dale Newbury David C. Joy Joseph Michael Joseph Goldstein John Henry Scott

Editura

Springer Verlag New York Inc.

An publicare

2017

Nr. Pagini

550

ISBN

9781493966745

Categorii

In Limbi Străine

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