Fundamentals of Electromigration-Aware Integrated Circuit Design

Fundamentals of Electromigration-Aware Integrated Circuit Design

Autor
Jens Lienig Matthias Thiele
Editura
Springer International Publishing Ag
An publicare
2018
Nr. Pagini
159
ISBN
9783319735573
Categorii
Fictiune In Limbi Străine
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Descriere

The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.

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