Conductive Atomic Force Microscopy

Conductive Atomic Force Microscopy

Autor
Mario Lanza
Editura
Wiley Vch
An publicare
2017
Nr. Pagini
384
ISBN
9783527340910
Categorii
In Limbi Străine Stiinte Chimie Matematica Si Stiinte
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Descriere

The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale.

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