Conductive Atomic Force Microscopy

Conductive Atomic Force Microscopy

Autor

Editura

An publicare

2017

Nr. Pagini

384

ISBN

9783527340910

Categorii

In Limbi Străine Stiinte Chimie Matematica Si Stiinte

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Descriere

The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale.

Comandă Cartea

576^Lei

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